EVENTS 2005 - PRESENT
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5 January 2010, Auditorium, Texas Instruments India, Bangalore 560093
Organized by: PragaTI (TI India Technical University), in association with VLSI Society of India, IEEE CAS Bangalore Chapter, and IEEE Bangalore Section
Speaker: Prof. Dimitri A. Antoniadis, MIT Microsystems Technology Laboratories, Cambridge, Massachusetts
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Report by: Dr.C.P.Ravikumar
On Jan 5, 2010, VLSI Society of India hosted a seminar by a distinguished speaker in Bangalore. Prof. Dimitri Antoniadis of Massachusetts Institute of Technology delivered a seminar entitled Technology Trends and Options for High Performance CMOS FETs at the 15-nm Generation and Beyond. This event was jointly organized by Texas Instruments Technical University, VLSI Society of India, the IEEE Bangalore Section, and IEEE CAS Bangalore Chapter. |
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 Prof. Dimitri A. Antoniadis, MIT Microsystems Technology Laboratories, Cambridge, Massachusetts |
 Dr. C.P. Ravikumar (Secretary, VSI & IEEE-CAS Bangalore Chapter), and Dr. Biswadeep (Bobby) Mitra (President & MD, Texas Instruments India) |
Today, the semiconductor industry is already using 45nm CMOS technology and is preparing for the next node. Prof. Antoniadis spoke about the challenges of CMOS scaling beyond 32nm. He spoke about the challenges in improving the performance of the transistor in the nanometer technologies of the future. He explained some of the solutions such as use of alternate materials, strain for improving the velocity of the carriers, and many others. He felt that design techniques will play a major role in these technologies for improving performance and power dissipation. |
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Dr. C.P. Ravikumar, Secretary of VSI and IEEE CAS Bangalore Chapter, welcomed the participants and introduced the speaker. Prof. Bobby Mitra, Managing Director and President of Texas Instruments, India, and President of VSI was present. |
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For Prof. Antoniadis, this was the first trip to India and to Bangalore. He expressed his happiness about the excellent interaction from the audience following the seminar. |
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