Exploring the Novel Characteristics of Hetero-Material Gate Field-Effect Transistors (HMGFET’s) with Gate Material Engineering

02-Sep-99

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Table of Contents

Exploring the Novel Characteristics of Hetero-Material Gate Field-Effect Transistors (HMGFET’s) with Gate Material Engineering

Presentation Outline

Background, Motivation, and Objectives

Structure of the HMGFET

Two Conceptual Processes to Realize the Proposed HMGFET

Computer Experiements

Numerical Models and Parameters

Simulated HMGFET Structure and Mesh

Linear Threshold vs. Gate or Channel Length for Different (Fixed) Values of S-Gate Length

DIBL Voltage vs. Gate or Channel Length for Different (Fixed) Values of S-Gate Length

Off-State Current vs. Gate or Channel Length for Different (Fixed) Values of S-Gate Length

Saturation Current vs. Gate or Channel Length for Different (Fixed) Values of S-Gate Length

On/Off Current Ratio vs. Gate or Channel Length for Different (Fixed) Values of S-Gate Length

Off-State Current vs. Saturation Current for Different (Fixed) Values of S-Gate Length

Threshold and DIBL Voltage vs. S-Gate Length At a Fixed Channel Length (Variable Lg/Ls Ratio)

Saturation and Leakage Current vs. S-Gate Length At a Fixed Channel Length (Variable Lg/Ls Ratio)

Transconductance, Drain Conductance, and Voltage Gain vs. S-Gate Length At a Fixed Channel Length (Variable Lg/Ls Ratio)

Threshold and DIBL Voltage vs. Channel Length At a Fixed (Optimum) Lg/Ls Ratio

I–V Characteristics for the HMGFET’s With Lc=0.25m and Ls=80nm, And With the Same Channel Doping Or Same Threshold As That of the SMGFET

Performance Improvement for the HMGFET’s With Lc=0.25m and Ls=80nm, And With the Same Channel Doping Or Same Threshold As That of the SMGFET

Ids–Vgs and gm–Vgs Characteristics for Different S-Gate Workfunctions At a Fixed Lc=0.25mm, Ls=80nm (HMGFET: Nch=1.18x1017 cm–3, SMGFET: Nch=4x1017 cm–3)

Threshold and DIBL Voltage vs. Workfunction Difference At a Fixed Lc=0.25mm and Ls=80nm

Saturation and Leakage Current vs. Workfunction Difference At a Fixed Lc=0.25mm and Ls=80nm

Transconductance, Drain Conductance, and Voltage Gain vs. Workfunction Difference At a Fixed Lc=0.25mm and Ls=80nm

Field Profiles (Off and On States) for the HMGFET’s (Lc=0.25mm and Ls=80nm) With the Same Channel Doping Or Same Threshold As That of the SMGFET

Velocity Profiles (Off and On States) for the HMGFET’s (Lc=0.25mm and Ls=80nm) With the Same Channel Doping Or Same Threshold As That of the SMGFET

Threshold and DIBL Voltage vs. Gate or Channel Length for the HMGFET With the Same Vt0=0.422V (@Lc=0.25mm) As That of the SMGFET

Transconductance, Drain Conductance, and Voltage Gain vs. Gate or Channel Length for the HMGFET (Vt0=0.422V @Lc=0.25mm) As That of the SMGFET

On/Off Current Ratio vs. Gate Length for the HMGFET With the Same Vt0=0.422V (@Lc=0.25mm) As That of the SMGFET

The Ultimate Performance Comparison: Will HMGFET Beat SMGFET for the Same Technology Node? And Beyond ...?

Discussions

Summary and Conclusions

Author: Xing Zhou 

Email: exzhou@ntu.edu.sg

Home Page: http://www.ntu.edu.sg/home/exzhou/Research/Project.htm#H