| Date |
Title
|
Venue
|
| Dec. 15, 1997 |
Multi-Level TCAD Synthesis Approach to the Design
and Optimization of Ultra-Small Transistors |
AMD, Sunnyvale, CA, USA |
| Feb. 11, 1998 |
The Virtual Wafer Fab Technology for the Deep-Submicron
ULSI Era |
EEE, NTU, Singapore |
| Apr. 21, 1999 |
A Predictive Length-Dependent Saturation Current Model
Based on Accurate Threshold Voltage Modeling  |
MSM99, San Juan, Puerto Rico, USA |
| Sep. 2, 1999 |
Exploring the Novel Characteristics of Hetero-Material
Gate Field-Effect Transistors (HMGFET's) with Gate Material Engineering |
EEE, NTU, Singapore |
| Sep. 13, 1999 |
MOSFET Compact I-V Modeling for Deep-Submicron
Technology Development |
EEE, NTU, Singapore |
| Dec. 2, 1999 |
A Compact Ids Model for Channel-Length Modulation
Including Velocity Overshoot  |
ISDRS-99, Charlottesville, VA, USA |
| Mar. 29, 2000 |
A Novel Approach to Compact I-V Modeling for Deep-Submicron
MOSFET's Technology Development with Process Correlation  |
MSM2000, San Diego, CA, USA |
| Sep. 6, 2000 |
MOSFET Compact I-V Modeling for Deep-Submicron
Technology Development |
IME, Tsinghua Univ., Beijing, PRC |
| Dec. 9, 2000 |
MOSFET Compact I-V Modeling for Deep-Submicron
Technology Development |
IIT, Bombay, India |
| Dec. 10, 2000 |
Mixed-Signal
Multi-Level Circuit Simulation: An Implicit Mixed-Mode Solution  |
IIT, Bombay, India |
| Mar. 16, 2001 |
Hetero-Material Gate Field-Effect Transistors
(HMGFET's)    |
Bluetooth Symposium, Santa Clara, CA, USA |
| Mar. 19, 2001 |
Experimental Determination of Electrical, Metallurgical,
and Physical Gate Lengths of Submicron MOSFET's    |
MSM2001, Hilton Head Island,
SC, USA |
| Mar. 20, 2001 |
Semi-Empirical
Approach to Modeling Reverse Short-Channel Effect in Submicron MOSFET's  |
MSM2001, Hilton Head Island,
SC, USA |
| Oct. 18, 2001 |
MOSFET
Compact I-V Modeling for Deep-Submicron Technology Development  |
Fudan University, Shanghai, PRC |
| Oct. 23, 2001 |
Technology-Dependent Modeling of Deep-Submicron
MOSFET's and ULSI Circuits    |
ICSICT2001,
Shanghai, PRC |
| Apr. 24, 2002 |
Xsim:
A Compact Model for Bridging Technology Developers and Circuit Designers  |
WCM-MSM2002,
San Juan, Puerto Rico, USA |
| June 20, 2002 |
Multi-Level
Modeling of Deep-Submicron MOSFETs and ULSI Circuits  |
MIXDES2002, Wroclaw, Poland |
| June 21, 2002 |
Mixed-Signal
Multi-Level Circuit Simulation: An Implicit Mixed-Mode Solution  |
MIXDES2002, Wroclaw, Poland |
| Dec. 13, 2002 |
Multi-Level
Modeling of Deep-Submicron CMOS ULSI Systems  |
IME, Tsinghua Univ. and Microelectronics R&D Center, CAS, Beijing,
PRC |
Jan. 21,
2003 |
MOSFET
Compact I-V Modeling for Deep-Submicron Technology Development  |
Research Center for Nanodevices and Systems, Hiroshima University,
Japan |
Jan. 28,
2003 |
Mixed-Signal
Multi-Level Circuit Simulation: An Implicit Mixed-Mode Solution  |
Research Center for Nanodevices and Systems, Hiroshima University,
Japan |
Feb. 25,
2003 |
A
Technology-Based Compact Model for Predictive Deep-Submicron MOSFET Modeling
and Characterization  |
WCM-MSM2003,
San Francisco, CA, USA |
Oct. 15,
2003 |
The
Missing Link to Seamless Simulation  |
WIMNACT-Singapore,
Singapore |
|
|
|
| Mar. 28, 2000 |
Modeling of Threshold Voltage with Reverse Short
Channel Effect
(by K. Y. Lim) |
MSM2000, San Diego, CA, USA |
| Dec. 29, 2000 |
Surface-Potential-Based Model of Reverse Short
Channel Effect in Submicrometer MOSFETs with Nonuniform Lateral Channel
Doping
(by Y. Wang)  |
ISMA2000, Singapore |
| Dec. 30, 2000 |
Investigation of reverse short channel effect
with numerical and compact models
(by Y. Wang)  |
ISMA2000, Singapore |
| Apr. 25, 2002 |
Physically-Based
Approach to Deep-Submicron MOSFET Compact Model Parameter Extraction
(by S. B. Chiah)  |
WCM-MSM2002,
San Juan, Puerto Rico, USA |
| Apr. 25, 2002 |
Compact
Model for Manufacturing Design and Fluctuation Study
(by K. Y. Lim)  |
WCM-MSM2002,
San Juan, Puerto Rico, USA |
Feb. 26,
2003 |
Unified
Length-/Width-Dependent Threshold Voltage Model with Reverse Short-Channel
and Inverse Narrow-Width Effects (by S. B. Chiah)  |
WCM-MSM2003,
San Francisco, CA, USA |
Feb. 26,
2003 |
Unified
Length-/Width-Dependent Drain Current Model for Deep-Submicron MOSFETs
(by S. B. Chiah)  |
WCM-MSM2003,
San Francisco, CA, USA |