Presentation Outline: Measurement: Definition and Characterization
Philosophy
- Minimum measurement-data requirement
- Simple, easy, terminal-current measurement
- Unambiguous and consistent definition
Definitions
- Vt: “critical-current at linear-threshold” (Icrit@Vt0)
- Ion: on-state saturation current (Ids @ Vgs = Vds = Vdd)
- Ioff: off-state leakage current (Ids @ Vgs = 0, Vds = Vdd)
Measurement — for a series of gate length devices on the same wafer (technology characterization)
- 13 I-V sweeps: 10 Ids-Vgs (@Vd0) for Icrit@Vt0 extraction
- 42 point (I, V) measurement data
A key to the success of the developed model:
Vt such defined is unique and contains SCE’s.