Presentation Outline: Conclusions
- Model success
- Separate, and physical, modeling of individual effects: Leff, meff, Rsd, VAeff, Isub, Iedge.
- Model parameter extraction at the “extreme” condition where its effect is most pronounced.
- Specific features
- Leff: bias-independent, close to metallurgical channel length extracted at Vgs = Vt (together with Vt).
- meff: physically based, including Coulombic, phonon, and surface roughness scatterings, in a compact form.
- Rsd: bias-independent (extrinsic) and bias-dependent (intrinsic) part, modeled separately with one extraction.
- VAeff: based on quasi-2D velocity saturation/overshoot but with a simple form and one extraction.
- Isub: correct diffusion-current modeling and smooth transition from weak to strong inversion, with the ability to “de-embed” the edge-leakage current.